DocumentCode :
2491849
Title :
Detection of malaria parasites in thick blood films
Author :
Elter, Matthias ; Hasslmeyer, E. ; Zerfass, T.
Author_Institution :
Image Process. & Med. Eng. Dept., Fraunhofer Inst. for Integrated Circuits IIS, Erlangen, Germany
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
5140
Lastpage :
5144
Abstract :
Malaria, caused by a blood parasite of the genus plasmodium, kills millions of people each year. According to the World Health Organization, the standard for malaria diagnosis is microscopic examination of a stained blood film. We have developed a two-stage algorithm for the automatic detection of plasmodia in thick blood films. The focus of the first stage is on high detection sensitivity while accepting high numbers of false-positive detections per image. The second stage reduces the number of false-positive detections to an acceptable level while maintaining the detection sensitivity of the first stage. The algorithm can detect plasmodia at a sensitivity of 0.97 with a mean number of 0.8 false-positive detections per image. Our results indicate that the proposed algorithm is suitable for the development of an automated microscope for computer-aided malaria screening.
Keywords :
blood; cellular biophysics; diseases; medical image processing; microorganisms; World Health Organization; automated microscopy; automatic plasmodia detection; computer-aided malaria screening; detection sensitivity; malaria diagnosis; malaria parasite detection; stained blood film; thick blood films; two-stage algorithm; Blood; Detection algorithms; Diseases; Feature extraction; Microscopy; Sensitivity; Training; Algorithms; Erythrocytes; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Malaria, Falciparum; Microscopy; Pattern Recognition, Automated; Plasmodium falciparum; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6091273
Filename :
6091273
Link To Document :
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