DocumentCode
2492015
Title
Towards Very High Frequency Simulators for Active Device Modelling
Author
Leuzzi, Giorgio ; Stornelli, Vincenzo
Author_Institution
Dept. of Electr. Eng., L´´Aquila Univ.
fYear
0
fDate
0-0 0
Firstpage
197
Lastpage
200
Abstract
In this paper physics based computer-aided simulation of microwave nonlinear circuits, completely performed in the frequency domain with spectral balance (SB), is addressed. The completely frequency-domain approach allows easy inclusion of frequency-dependent parameters of the semiconductor, especially important at very high frequencies (e.g. dielectric constant), and easy and straightforward coupling to the passive external environment. The absence of time-frequency domain transformations typical of harmonic balance schemes allows easy extension to multitone analysis. This technique is suitable for develop new CAD tools useful for the design of microwave integrated components and monolithic microwave integrated circuits especially when "global analysis" is request and multitone excitation is present. Simulation results, for both the SB and a classical FDTD methods, are presented and compared in terms of complexity and CPU load time, for a quasi-two-dimensional hydrodynamic physical model of a MOSFET device
Keywords
MMIC; MOSFET; frequency-domain analysis; integrated circuit modelling; nonlinear network analysis; semiconductor device models; CAD tools; MOSFET device; active device modelling; frequency domain; harmonic balance schemes; hydrodynamic physical model; microwave integrated components; microwave nonlinear circuits; monolithic microwave integrated circuits; multitone analysis; multitone excitation; physics based computer-aided simulation; spectral balance; time-frequency domain transformations; very high frequency simulators; Circuit simulation; Computational modeling; Computer simulation; Coupling circuits; Frequency domain analysis; High-K gate dielectrics; Microwave devices; Microwave theory and techniques; Nonlinear circuits; Physics computing; Computer-aided analysis; Electron device modeling; Frequency domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Research in Microelectronics and Electronics 2006, Ph. D.
Conference_Location
Otranto
Print_ISBN
1-4244-0157-7
Type
conf
DOI
10.1109/RME.2006.1689930
Filename
1689930
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