DocumentCode :
2492402
Title :
Comparison of 4H-SiC Separate Absorption and Multiplication Region Avalanche Photodiodes Structures for UV Detection
Author :
Cha, Ho-Young ; Soloviev, Stanislav ; Dunne, Greg ; Rowland, Larry ; Zelakiewicz, Scott ; Waldrab, P. ; Sandvik, Peter
Author_Institution :
GE Global Res., Niskayuna
fYear :
2006
fDate :
22-25 Oct. 2006
Firstpage :
14
Lastpage :
17
Abstract :
We designed and fabricated silicon carbide (SiC) separate absorption multiplication region avalanche photodiodes (SAM-APDs) for UV detection in harsh environment applications. Two variations of device types were compared. Type I was designed to achieve reach-through (i.e. multiplication, charge, and absorption layers are depleted) prior to reaching high gain while Type II was designed not to achieve reach-through (i.e. only the multiplication region is depleted). It was found that both the dark current behavior and the responsivity were improved significantly by employing a nonreach-through design. According to preliminary measurements, the maximum quantum efficiency of the type II was ~70 % at the wavelength of 300 nm.
Keywords :
avalanche photodiodes; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 4H-SiC; SiC; UV detection; avalanche photodiodes; dark current behavior; harsh environment; maximum quantum efficiency; nonreach-through design; responsivity; separate absorption multiplication region; silicon carbide; wavelength 300 nm; wide bandgap semiconductor; Anodes; Avalanche photodiodes; Cathodes; Dark current; Electromagnetic wave absorption; Ionization; Plasma applications; Silicon carbide; Stability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
ISSN :
1930-0395
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2007.355706
Filename :
4178544
Link To Document :
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