DocumentCode
2492513
Title
Software defect prediction using static code metrics underestimates defect-proneness
Author
Gray, David ; Bowes, David ; Davey, Neil ; Sun, Yi ; Christianson, Bruce
Author_Institution
Comput. Sci. Dept., Univ. of Hertfordshire, Hatfield, UK
fYear
2010
fDate
18-23 July 2010
Firstpage
1
Lastpage
7
Abstract
Many studies have been carried out to predict the presence of software code defects using static code metrics. Such studies typically report how a classifier performs with real world data, but usually no analysis of the predictions is carried out. An analysis of this kind may be worthwhile as it can illuminate the motivation behind the predictions and the severity of the misclassifications. This investigation involves a manual analysis of the predictions made by Support Vector Machine classifiers using data from the NASA Metrics Data Program repository. The findings show that the predictions are generally well motivated and that the classifiers were, on average, more “confident” in the predictions they made which were correct.
Keywords
program diagnostics; software metrics; support vector machines; defect-proneness; software code defect; software defect prediction; static code metrics; support vector machine classifier; Complexity theory; Kernel; Measurement; NASA; Support vector machines; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks (IJCNN), The 2010 International Joint Conference on
Conference_Location
Barcelona
ISSN
1098-7576
Print_ISBN
978-1-4244-6916-1
Type
conf
DOI
10.1109/IJCNN.2010.5596650
Filename
5596650
Link To Document