• DocumentCode
    2492513
  • Title

    Software defect prediction using static code metrics underestimates defect-proneness

  • Author

    Gray, David ; Bowes, David ; Davey, Neil ; Sun, Yi ; Christianson, Bruce

  • Author_Institution
    Comput. Sci. Dept., Univ. of Hertfordshire, Hatfield, UK
  • fYear
    2010
  • fDate
    18-23 July 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Many studies have been carried out to predict the presence of software code defects using static code metrics. Such studies typically report how a classifier performs with real world data, but usually no analysis of the predictions is carried out. An analysis of this kind may be worthwhile as it can illuminate the motivation behind the predictions and the severity of the misclassifications. This investigation involves a manual analysis of the predictions made by Support Vector Machine classifiers using data from the NASA Metrics Data Program repository. The findings show that the predictions are generally well motivated and that the classifiers were, on average, more “confident” in the predictions they made which were correct.
  • Keywords
    program diagnostics; software metrics; support vector machines; defect-proneness; software code defect; software defect prediction; static code metrics; support vector machine classifier; Complexity theory; Kernel; Measurement; NASA; Support vector machines; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks (IJCNN), The 2010 International Joint Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-6916-1
  • Type

    conf

  • DOI
    10.1109/IJCNN.2010.5596650
  • Filename
    5596650