DocumentCode
2492751
Title
Fabrication and characterization of deeply-etched SiO2 waveguides
Author
Sheng, Zhen ; Yang, Liu ; Dai, Daoxin ; Lang, Tingting ; Wang, Zhechao
Author_Institution
Zhejiang Univ., Hangzhou
fYear
2007
fDate
17-19 Oct. 2007
Firstpage
517
Lastpage
519
Abstract
Deeply-etched SiO2 waveguide is fabricated and characterized. The fabrication process is easier than the conventional buried SiO2 waveguide. The fabricated waveguide exhibits good performances, such as low propagation loss, broad band.
Keywords
etching; optical fibre fabrication; silicon compounds; SiO2; buried SiO2 waveguide; deeply-etched SiO2 waveguides; optical fibre fabrication; Electromagnetic waveguides; Etching; Optical buffering; Optical device fabrication; Optical losses; Optical scattering; Optical waveguides; Propagation losses; Silicon compounds; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communication and Optoelectronics Conference, 2007 Asia
Conference_Location
Shanghai
Print_ISBN
978-0-9789217-2-9
Electronic_ISBN
978-0-9789217-2-9
Type
conf
DOI
10.1109/AOE.2007.4410860
Filename
4410860
Link To Document