Title :
Microscopic observation of the temperature coefficient distribution of dielectric material for microwave application using scanning photothermal dielectric microscope
Author :
Cho, Y. ; Kasahara, T. ; Fukuda, K.
Author_Institution :
Dept. Electr. & Electron. Eng., Yamaguchi Univ., Ube, Japan
Abstract :
Two dimensional images of the temperature coefficient of the distribution of the dielectric constant of a two phases composite ceramics composed of TiO/sub 2/ and Bi/sub 2/Ti/sub 4/O/sub 11/ are observed using scanning photothermal dielectric microscope. The obtained images clearly show that the each grain of TiO/sub 2/ and Bi/sub 2/Ti/sub 4/O/sub 11/ in the ceramics has a negative and a positive temperature coefficient, respectively and that the macroscopic averaged temperature coefficient of the ceramics is relatively low due to the cancellation of the coefficients with the opposite signs.
Keywords :
bismuth compounds; ceramics; dielectric materials; microscopy; microwave measurement; permittivity measurement; photothermal effects; titanium compounds; TiO/sub 2/-Bi/sub 2/Ti/sub 4/O/sub 11/; dielectric constant; dielectric material; microwave application; scanning photothermal dielectric microscope; temperature coefficient distribution; two dimensional image; two phase composite ceramic; Capacitance; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Electrodes; Frequency; Microscopy; Temperature distribution; Temperature sensors;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596704
