Skin cancer detection using spectroscopic oblique-incidence reflectometry

Author

Garcia-Uribe, A. ; Kehtarnavaz, Nasser ; Marquez, Guillermo ; Mehrubeoglu, Mehrube ; Prieto, V.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

Volume

3

fYear

2002

fDate

23-26 Oct. 2002

Firstpage

2249

Abstract

This paper presents a technique for classifying skin abnormalities using oblique-incidence diffuse reflectance spectroscopy. The objective is to provide a non-invasive computer-assisted tool to dermatologists for lowering the number of unnecessary biopsies. A high accuracy of detection (95%) has been obtained.

Keywords

bio-optics; cancer; medical diagnostic computing; patient diagnosis; reflectometry; skin; spectroscopy; diagnostic decisions; electronic second opinion; high detection accuracy; medical diagnostic technique; noninvasive computer-assisted tool; oblique-incidence diffuse reflectance spectroscopy; skin cancer detection; spectroscopic oblique-incidence reflectometry; suspicious skin abnormalities; unnecessary biopsies number lowering; unwanted benign biopsies; Biopsy; Cancer detection; Continuous wavelet transforms; Image analysis; Lesions; Optical scattering; Reflectivity; Reflectometry; Skin cancer; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint

ISSN

1094-687X

Print_ISBN

0-7803-7612-9

Type

conf

DOI

10.1109/IEMBS.2002.1053266

Filename

1053266