Title :
Skin cancer detection using spectroscopic oblique-incidence reflectometry
Author :
Garcia-Uribe, A. ; Kehtarnavaz, Nasser ; Marquez, Guillermo ; Mehrubeoglu, Mehrube ; Prieto, V.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
This paper presents a technique for classifying skin abnormalities using oblique-incidence diffuse reflectance spectroscopy. The objective is to provide a non-invasive computer-assisted tool to dermatologists for lowering the number of unnecessary biopsies. A high accuracy of detection (95%) has been obtained.
Keywords :
bio-optics; cancer; medical diagnostic computing; patient diagnosis; reflectometry; skin; spectroscopy; diagnostic decisions; electronic second opinion; high detection accuracy; medical diagnostic technique; noninvasive computer-assisted tool; oblique-incidence diffuse reflectance spectroscopy; skin cancer detection; spectroscopic oblique-incidence reflectometry; suspicious skin abnormalities; unnecessary biopsies number lowering; unwanted benign biopsies; Biopsy; Cancer detection; Continuous wavelet transforms; Image analysis; Lesions; Optical scattering; Reflectivity; Reflectometry; Skin cancer; Spectroscopy;
Conference_Titel :
Engineering in Medicine and Biology, 2002. 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society EMBS/BMES Conference, 2002. Proceedings of the Second Joint
Print_ISBN :
0-7803-7612-9
DOI :
10.1109/IEMBS.2002.1053266
