Title :
Impedance Spectroscopy on Solid State Electrochemical Sensors and Devices: Potentials and Pitfalls
Author_Institution :
Chonnam Nat. Univ., Gwangju
Abstract :
In this contribution recent exemplary applications of impedance spectroscopy in characterization of solid state electrochemical devices will be presented. Serial electrical and electrochemical processes, each modeled as a RC parallel element, can be most successfully distinguished in conventional impedance plane representation, where the associated capacitance values are different by orders of magnitude. In the presence of short-circuiting grain boundary phase in Mg-Zr-O-N specimens, micro-contact impedance spectroscopy is employed to extract the bulk crystal conductivity. Ionic conduction responsible for the leakage current in CaF2 thin films on Si substrates can be unambiguously revealed by modulus spectroscopy. A general transmission line model is applied to describe a model mixed ionic and electronic conductor Ag2S with semi-blocking electrode conditions.
Keywords :
electrochemical impedance spectroscopy; electrochemical sensors; equivalent circuits; grain boundaries; ionic conductivity; substrates; thin films; Ionic conduction; RC parallel element; bulk crystal conductivity; electrochemical processes; general transmission line model; impedance plane representation; impedance spectroscopy; leakage current; microcontact impedance spectroscopy; short-circuiting grain boundary phase; solid state electrochemical sensors; substrates; thin films; Capacitance; Conductivity; Electrochemical devices; Electrochemical impedance spectroscopy; Electrochemical processes; Grain boundaries; Leakage current; Semiconductor thin films; Sensor phenomena and characterization; Solid state circuits;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355770