• DocumentCode
    249357
  • Title

    A Scanning Electron Microscope image segmentation method for steam generator fouling rate estimation

  • Author

    Le Guen, Vincent ; Paul, Nicolas

  • Author_Institution
    STEP Dept., EDF R&D, Chatou, France
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    4447
  • Lastpage
    4451
  • Abstract
    In this paper, we propose a new approach to segment Scanning Electron Microscope (SEM) images and separate particles from background. The automatic segmentation of SEM images is a challenging problem owing to illumination non-homogeneities and image variability. We take advantage of priors on the inspected material as well as complementary clues (intensity, space and contours) to get a segmentation method as robust as possible on a wide range of images. The proposed algorithm first applies the mean-shift clustering procedure, which consists in successively detecting the modes of the image probability density function and merging them with intensity and contour clues. Then a spatially constrained K-Means algorithm alternatively estimates the bias field and classifies pixels between crystal and background. This method was successfully applied to compute the fouling rate of a nuclear plant steam generator tube mock-up.
  • Keywords
    boilers; computerised instrumentation; image classification; image segmentation; scanning electron microscopes; SEM image segmentation; constrained k-means algorithm; illumination nonhomogeneities; image probability density function; image variability; mean-shift clustering procedure; nuclear plant steam generator tube mock-up; scanning electron microscope image segmentation method; steam generator fouling rate estimation; Clustering algorithms; Crystals; Generators; Image edge detection; Image segmentation; Merging; Scanning electron microscopy; Scanning electron microscopy; bias field correction; classification; segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025902
  • Filename
    7025902