• DocumentCode
    2493851
  • Title

    Hydrogen sensitivity of GaAs HEMT amplifiers: the effect of bias mode

  • Author

    Eng, David C. ; Scarpulla, John

  • Author_Institution
    TRW Inc., Redondo Beach, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    89
  • Lastpage
    93
  • Abstract
    The effect of hydrogen incorporation is well known to degrade the performance of GaAs HEMT transistors. The main source of hydrogen is in the plated internal metal surfaces of a hermetic enclosure used to package GaAs MMICs. We have found a new circuit technique for hydrogen mitigation, which may be useful under certain circumstances - use of a current regulation scheme for each transistor in a MMIC. The value of this method is that even under extremely high levels of hydrogen and accelerated temperature conditions where the HEMTs are expected to fully saturate with hydrogen, the net effect on RF gain degradation can be minimized to a tolerably low level
  • Keywords
    HEMT circuits; III-V semiconductors; MMIC amplifiers; field effect MMIC; gallium arsenide; hydrogen; GaAs HEMT; GaAs:H; MMIC amplifier; RF gain; bias mode; circuit technique; hydrogen sensitivity; Acceleration; Circuits; Current control; Degradation; Gallium arsenide; HEMTs; Hydrogen; MMICs; Packaging; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    GaAs Reliability Workshop, 1999. Proceedings
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7908-0100-0
  • Type

    conf

  • DOI
    10.1109/GAASRW.1999.874167
  • Filename
    874167