DocumentCode
2493851
Title
Hydrogen sensitivity of GaAs HEMT amplifiers: the effect of bias mode
Author
Eng, David C. ; Scarpulla, John
Author_Institution
TRW Inc., Redondo Beach, CA, USA
fYear
1999
fDate
1999
Firstpage
89
Lastpage
93
Abstract
The effect of hydrogen incorporation is well known to degrade the performance of GaAs HEMT transistors. The main source of hydrogen is in the plated internal metal surfaces of a hermetic enclosure used to package GaAs MMICs. We have found a new circuit technique for hydrogen mitigation, which may be useful under certain circumstances - use of a current regulation scheme for each transistor in a MMIC. The value of this method is that even under extremely high levels of hydrogen and accelerated temperature conditions where the HEMTs are expected to fully saturate with hydrogen, the net effect on RF gain degradation can be minimized to a tolerably low level
Keywords
HEMT circuits; III-V semiconductors; MMIC amplifiers; field effect MMIC; gallium arsenide; hydrogen; GaAs HEMT; GaAs:H; MMIC amplifier; RF gain; bias mode; circuit technique; hydrogen sensitivity; Acceleration; Circuits; Current control; Degradation; Gallium arsenide; HEMTs; Hydrogen; MMICs; Packaging; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 1999. Proceedings
Conference_Location
Monterey, CA
Print_ISBN
0-7908-0100-0
Type
conf
DOI
10.1109/GAASRW.1999.874167
Filename
874167
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