DocumentCode :
2493889
Title :
Modeling and testing of a 1-stage microwave PIN-diode limiter
Author :
Shnitnikov, A.S. ; Gudkova, N.B.
Author_Institution :
Moscow Power Eng. Inst., Russia
fYear :
2004
fDate :
13-17 Sept. 2004
Firstpage :
170
Lastpage :
171
Abstract :
The characteristics of an X-band PIN-diode limiter are presented. A one-dimensional numerical diode model is used for the analysis. The influence of the diode base thickness on the computed and measured power-limiting characteristic and on the power dissipated in the diodes is investigated. The used modeling technique has proved to be an effective tool for the development of microwave control devices.
Keywords :
microwave diodes; microwave limiters; p-i-n diodes; semiconductor device models; X-band limiter; diode base thickness; microwave PIN-diode limiter; microwave control devices; microwave limiter; one-dimensional numerical diode model; Continuous wavelet transforms; Fault detection; Organizing; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2004. CriMico 2004. 2004 14th International Crimean Conference on
Print_ISBN :
966-7968-69-3
Type :
conf
DOI :
10.1109/CRMICO.2004.183149
Filename :
1390131
Link To Document :
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