DocumentCode :
2494470
Title :
Developing an underfill process for dense flip chip applications
Author :
Leong, William H.
Author_Institution :
Electron. Assembly Dev. Center, Hewlett-Packard Co., Palo Alto, CA, USA
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
10
Lastpage :
17
Abstract :
HP´s current generation workstation processor uses flip chip on ceramic technology to help achieve increased clock speeds and higher I/O count. Due to the large die size, underfill is needed to improve the fatigue life of the flip chip solder connections. The processor package offers limited access for dispensing the underfill, and places limits on excess flow on top of and around the die. An underfill process was developed for the processor that consists of depositing the underfill material in multiple passes. A series of experiments were performed to characterize the material properties, flow, and dispense equipment, and to optimize the cycle time. This paper presents the different experiments and a methodology for combining the results to specify a process. The results of this work can be applied to develop an underfill process for similar applications involving large flip chip die with limited dispensing access
Keywords :
fatigue; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; reflow soldering; cycle time; dense flip chip applications; dispensing access; excess flow; fatigue life; multiple passes; solder connections; underfill process; Ceramics; Clocks; Curing; Fatigue; Flip chip; Material properties; Packaging; Temperature; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559676
Filename :
559676
Link To Document :
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