Title : 
Final X-Ray Control of the Orientation of Round or Rectangular Quartz Slides for Industrial Purposes
         
        
            Author : 
Darces, J.F. ; Merigoux, H.
         
        
        
        
        
        
            Keywords : 
Automatic control; Crystallography; Diffraction; Industrial control; Laboratories; Optical resonators; Particle measurements; Rotation measurement; X-ray detection; X-ray detectors;
         
        
        
        
            Conference_Titel : 
32nd Annual Symposium on Frequency Control. 1978
         
        
        
            DOI : 
10.1109/FREQ.1978.200253