DocumentCode
2495085
Title
CMOS scaling toward sub-10 nm regime
Author
Iwai, Hiroshi
Author_Institution
Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear
2003
fDate
17-18 Nov. 2003
Firstpage
30
Lastpage
34
Abstract
Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
Keywords
CMOS integrated circuits; MOSFET; integrated circuit reliability; large scale integration; nanoelectronics; CMOS LSIs; CMOS downsizing; CMOS scaling; large scale integrated circuits; p-channel MOSFET; small-geometry MOSFETs; Acceleration; CMOS technology; Collaboration; Electronic circuits; Humans; Integrated circuit technology; Intelligent robots; Large scale integration; MOSFET circuits; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN
0-7803-7904-7
Type
conf
DOI
10.1109/EDMO.2003.1259967
Filename
1259967
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