DocumentCode :
2495085
Title :
CMOS scaling toward sub-10 nm regime
Author :
Iwai, Hiroshi
Author_Institution :
Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2003
fDate :
17-18 Nov. 2003
Firstpage :
30
Lastpage :
34
Abstract :
Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit reliability; large scale integration; nanoelectronics; CMOS LSIs; CMOS downsizing; CMOS scaling; large scale integrated circuits; p-channel MOSFET; small-geometry MOSFETs; Acceleration; CMOS technology; Collaboration; Electronic circuits; Humans; Integrated circuit technology; Intelligent robots; Large scale integration; MOSFET circuits; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN :
0-7803-7904-7
Type :
conf
DOI :
10.1109/EDMO.2003.1259967
Filename :
1259967
Link To Document :
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