• DocumentCode
    2495085
  • Title

    CMOS scaling toward sub-10 nm regime

  • Author

    Iwai, Hiroshi

  • Author_Institution
    Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2003
  • fDate
    17-18 Nov. 2003
  • Firstpage
    30
  • Lastpage
    34
  • Abstract
    Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
  • Keywords
    CMOS integrated circuits; MOSFET; integrated circuit reliability; large scale integration; nanoelectronics; CMOS LSIs; CMOS downsizing; CMOS scaling; large scale integrated circuits; p-channel MOSFET; small-geometry MOSFETs; Acceleration; CMOS technology; Collaboration; Electronic circuits; Humans; Integrated circuit technology; Intelligent robots; Large scale integration; MOSFET circuits; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
  • Print_ISBN
    0-7803-7904-7
  • Type

    conf

  • DOI
    10.1109/EDMO.2003.1259967
  • Filename
    1259967