Title :
Process development for the formation of post-bonding biorecognition layers in microfluidic biosensors
Author :
Perez, Martin G. ; Kanikella, Phaninder R. ; Reck, James N. ; Kim, Chang-Soo ; O´Keefe, M.J.
Author_Institution :
Univ. of Missouri, Rolla
Abstract :
Formation of the biorecognition layers within microfluidic sensor channels must be done after the completion of the channel structure since these layers cannot withstand the wafer bonding temperature. We propose a new post-bonding immobilization process to prepare the enzyme layers within microfluidic channels of electrochemical biosensors. An array of Pt vertical electrodes is electroplated using a SU-8 mold. The cured SU-8 is then removed by plasma etching to expose the Pt electrode and to define the fluidic channel cavity simultaneously. An array of enzyme posts is formed on the Pt surface by either electropolymerizing or photopolymerizing enzyme precursor solutions injected into the channel. Very little report is available about the reactive ion etching (RIE) of SU-8 that is the most critical step in this process. A systematic investigation on the RIE of SU-8 is conducted to obtain the maximum etch rate (1.2 mum/min.) based on different combinations of parameters of CF4 and O2 gas flow, RF power and time.
Keywords :
biosensors; electrochemical sensors; electroplating; microfluidics; microsensors; polymerisation; sputter etching; Pt electrode; SU-8 mold; channel structure; electrochemical biosensors; electroplating; electropolymerization; enzyme layers; enzyme posts; enzyme precursor solutions; fluidic channel cavity; microfluidic biosensors; microfluidic channels; microfluidic sensor channels; photopolymerization; plasma etching; post-bonding biorecognition layers; post-bonding immobilization process; process development; reactive ion etching; vertical electrodes; Biochemistry; Biosensors; Electrodes; Etching; Fluid flow; Microfluidics; Plasma applications; Plasma temperature; Temperature sensors; Wafer bonding;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355548