DocumentCode
2495392
Title
Effects of dispatching and down time on the performance of wafer fabs operating under theory of constraints
Author
Kayton, David ; Teyner, Tim ; Schwartz, Christopher ; Uzsoy, Reha
Author_Institution
Harris Semicond., Findlay, OH, USA
fYear
1996
fDate
14-16 Oct 1996
Firstpage
49
Lastpage
56
Abstract
A number of companies have reported significant improvements in manufacturing performance through implementing the concepts of the Theory of Constraints suggested by Goldratt (1986). However, the implementation of these concepts in wafer fabs is not straightforward due to the presence of reentrant product flows. In this paper we examine the effects of downtime at non-bottleneck machines and different dispatching rules on the performance of a wafer fab operating under the Drum-Buffer-Rope release policy (Goldratt and Fox 1986). Our results show that downtime at non-bottleneck machines has significant detrimental effects on fab performance, and that the Critical Ratio dispatching rule performs well in terms of the tradeoff between cycle time and throughput
Keywords
computer aided production planning; constraint theory; dispatching; integrated circuit manufacture; production control; IC manufacture; constraint theory; critical ratio; cycle time; dispatching rules; dispatching time; down time; drum-buffer-rope release policy; manufacturing performance; nonbottleneck machines; reentrant product flows; semiconductor wafer fabrication; throughput; wafer fabs; Chemical industry; Circuits; Constraint theory; Dispatching; Fabrication; Industrial engineering; Job shop scheduling; Manufacturing; Semiconductor device manufacture; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-3642-9
Type
conf
DOI
10.1109/IEMT.1996.559681
Filename
559681
Link To Document