• DocumentCode
    2495521
  • Title

    Reliability investigation of photovoltaic cell using finite element modeling

  • Author

    Ai-Habahbeh, O.M. ; Ai-Hrout, B.A. ; Al-Hiary, E.M. ; Ai-Fraihat, S.A.

  • Author_Institution
    Mechatron. Eng. Dept., Univ. of Jordan, Amman, Jordan
  • fYear
    2013
  • fDate
    9-11 April 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The reliability of Monocrystalline photovoltaic cells (PVC) is investigated using modeling and simulation. Despite that experimental data on this topic is available; it is only for PVC types that existed many years ago. On the other hand, for new designs, long waiting periods are needed. Therefore, it is desired to build a model that can predict PVC reliability using numerical simulation. The advantage of the model is that it eliminates the need to wait many years to get the results, as the results can be obtained using modeling and simulation. However, with this huge time saving comes a difficulty; that is finding a suitable prediction model. In this work, a reliability prediction model is built and tested. The model is based on thermal stress failure, where solar radiation temperature is converted to thermal stress imposed on the module. The temperature history was taken into account, and different types of stress were calculated. Based on stresses, fatigue life was investigated. Eventually, even though the model turned out to be good for design and analysis of PV cells, it still needs more development so as to serve as a PVC reliability prediction tool.
  • Keywords
    failure analysis; fatigue; finite element analysis; power generation reliability; prediction theory; solar cells; sunlight; thermal stresses; PV cell analysis; PV cell design; PVC reliability prediction tool; fatigue life; finite element modeling; long waiting periods; monocrystalline PVC reliability; monocrystalline photovoltaic cells reliability; numerical simulation; photovoltaic cell reliability; prediction model; reliability prediction model; solar radiation temperature; thermal stress failure; Photovoltaic cells; Photovoltaic systems; Reliability; Silicon; Stress; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronics and its Applications (ISMA), 2013 9th International Symposium on
  • Conference_Location
    Amman
  • Print_ISBN
    978-1-4673-5014-3
  • Type

    conf

  • DOI
    10.1109/ISMA.2013.6547391
  • Filename
    6547391