Title :
Quartz Crystal Measurements by a Phase-Amplitude Method
Author :
Beaver, W.D. ; Sels, W. Van Loben ; Wang, M.
Keywords :
Automatic testing; Capacitance measurement; Circuit testing; Crystals; Electrical resistance measurement; Frequency measurement; Phase measurement; Resonance; System testing; Temperature distribution;
Conference_Titel :
33rd Annual Symposium on Frequency Control. 1979
DOI :
10.1109/FREQ.1979.200315