Title :
Session 4 Signal and power integrity
Author :
Atsushi Nakamura ; Sudo, Toshio
Author_Institution :
Renesas Technology Corp., Japan
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
VLSI Packaging Workshop of Japan, 2008. VPWJ 2008. IEEE 9th
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-3498-5
DOI :
10.1109/VPWJ.2008.4762207
