Title :
An efficient procedure for obtaining implication relations and its application to redundancy identification
Author :
Ichiahra, Hideyuki ; Kajihara, Seiji ; Kinoshita, Kozo
Author_Institution :
Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Fukuoka, Japan
Abstract :
The procedure used in static learning extracts implication relations of the logic circuit. The number of extracted implication relations depends on the order of signal lines processed. In this paper we propose an efficient method to extract implication relations by considering the order of signal lines to be processed. Experimental results show that the proposed order finds more implication relations than others and is effective for redundancy identification
Keywords :
VLSI; circuit optimisation; integrated circuit design; logic CAD; redundancy; VLSI; implication relations; logic CAD; logic circuit; redundancy identification; signal lines; static learning; Application software; Boolean functions; Circuit testing; Computer science; Data structures; Fires; Logic circuits; Logic functions; Physics; Signal processing;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741586