Title :
A review on ESD protection for RF and microwave ICs
Author :
Wang, Albert ; Feng, H. ; Chen, Gang ; Zhan, R. ; Xie, H. ; Wu, Q. ; Guan, X.
Author_Institution :
Dept. of ECE, Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
This paper reviews the key issues in designing on-chip ESD (electrostatic discharge) protection structures for RF and microwave ICs. ESD protection basics, uniqueness in RF ESD protection, design methods, RF ESD protection characterization techniques and design optimization are discussed.
Keywords :
circuit optimisation; electrostatic discharge; integrated circuit design; microwave integrated circuits; radiofrequency integrated circuits; ESD protection; RF IC; design optimization; electrostatic discharge; microwave IC; on-chip ESD; protection structures; Circuit simulation; Clamps; Design methodology; Electrostatic discharge; MOS devices; Protection; Radio frequency; Radiofrequency integrated circuits; Thermal resistance; Voltage;
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN :
0-7803-7904-7
DOI :
10.1109/EDMO.2003.1260031
