• DocumentCode
    2496499
  • Title

    Accurate CAD modelling of metal conduction losses at terahertz frequencies

  • Author

    Lucyszyn, Stepan

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Imperial Coll., London, UK
  • fYear
    2003
  • fDate
    17-18 Nov. 2003
  • Firstpage
    180
  • Lastpage
    185
  • Abstract
    Being able to accurately characterize the terahertz performance of simple metal conductors is very important for the CAD modelling of components, circuits and systems operating at these frequencies. A comprehensive survey of published experimental data for the room temperature surface resistance of simple metals, from DC up to the edge of the mid-infrared frequency range, has been undertaken. It has been found that, with the optical measurements performed within the far-IR region, there does not appear to be anomalous intrinsic conduction loss phenomenon at room temperature; this is in direct contradiction to the findings of other research groups. This is because the non-optical measurement approaches adopted by Tischer, Schwab et al. and Batt et al. are fundamentally flawed, since anomalous findings could be attributed to one or more factors that were not taken into account.
  • Keywords
    circuit CAD; losses; millimetre wave measurement; CAD modelling; far-IR region; intrinsic conduction loss phenomenon; metal conduction losses; nonoptical measurement; optical measurements; surface resistance; terahertz frequencies; Conducting materials; Conductivity; Conductors; Frequency; Loss measurement; Optical devices; Optical losses; Pollution measurement; Surface resistance; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
  • Print_ISBN
    0-7803-7904-7
  • Type

    conf

  • DOI
    10.1109/EDMO.2003.1260036
  • Filename
    1260036