DocumentCode
2496499
Title
Accurate CAD modelling of metal conduction losses at terahertz frequencies
Author
Lucyszyn, Stepan
Author_Institution
Dept. of Electron. & Electr. Eng., Imperial Coll., London, UK
fYear
2003
fDate
17-18 Nov. 2003
Firstpage
180
Lastpage
185
Abstract
Being able to accurately characterize the terahertz performance of simple metal conductors is very important for the CAD modelling of components, circuits and systems operating at these frequencies. A comprehensive survey of published experimental data for the room temperature surface resistance of simple metals, from DC up to the edge of the mid-infrared frequency range, has been undertaken. It has been found that, with the optical measurements performed within the far-IR region, there does not appear to be anomalous intrinsic conduction loss phenomenon at room temperature; this is in direct contradiction to the findings of other research groups. This is because the non-optical measurement approaches adopted by Tischer, Schwab et al. and Batt et al. are fundamentally flawed, since anomalous findings could be attributed to one or more factors that were not taken into account.
Keywords
circuit CAD; losses; millimetre wave measurement; CAD modelling; far-IR region; intrinsic conduction loss phenomenon; metal conduction losses; nonoptical measurement; optical measurements; surface resistance; terahertz frequencies; Conducting materials; Conductivity; Conductors; Frequency; Loss measurement; Optical devices; Optical losses; Pollution measurement; Surface resistance; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN
0-7803-7904-7
Type
conf
DOI
10.1109/EDMO.2003.1260036
Filename
1260036
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