Title :
Etching Studies on Singly and Doubly Rotated Quartz Plates
Author :
Vig, John R. ; Brandmayr, Ronald J. ; Filler, Raymond L.
Keywords :
Chemicals; Etching; Frequency; Hafnium; Laboratories; Rough surfaces; Scanning electron microscopy; Surface morphology; Surface roughness; Surface topography;
Conference_Titel :
33rd Annual Symposium on Frequency Control. 1979
DOI :
10.1109/FREQ.1979.200338
