DocumentCode
2496602
Title
ATE features for Iddq testing
Author
Faust, Mark G.
Author_Institution
Credence Syst. Corp., Beaverton, OR, USA
fYear
1998
fDate
2-4 Dec 1998
Firstpage
153
Lastpage
157
Abstract
This paper briefly reviews the value of Iddq testing and the challenges it presents traditional ATE hardware and software. It then describes several new hardware and software innovations to support Iddq testing and other Idd measurements which have been incorporated into a commercial ATE system
Keywords
CMOS digital integrated circuits; automatic test equipment; automatic test software; electric current measurement; integrated circuit testing; leakage currents; ATE hardware; ATE software; Iddq testing; commercial ATE system; complex CMOS devices; fault coverage; gate-oxide shorts; low current measurement capability; vector-triggered device power supply; Circuit faults; Circuit testing; Current measurement; Decision support systems; Fiber reinforced plastics; Instruments; Power measurement; Production; Software testing; Switches; System testing; Testing; Time measurement; Virtual reality;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741607
Filename
741607
Link To Document