• DocumentCode
    2496603
  • Title

    Achieving Fault Tolerance in Data Aggregation in Wireless Sensor Networks

  • Author

    Banerjee, Torsha ; Xie, Bin ; Agrawal, Dharma P.

  • Author_Institution
    Univ. of Cincinnati, Cincinnati
  • fYear
    2007
  • fDate
    26-30 Nov. 2007
  • Firstpage
    926
  • Lastpage
    930
  • Abstract
    This paper identifies faulty sensor(s) in a polynomial-based data aggregation scenario, TREG proposed in our earlier work. In TREG, function approximation is performed over the entire range of data and only coefficients of a polynomial (P) are passed instead of aggregated data. Performing further mathematical operations on the calculated P can identify the maximum (max) and minimum (min) values of the sensed attribute and their locations. Therefore, if any sensor reports a data value outside the [min, max] range, it can be identified as a faulty sensor. We achieve the following goals: (1) uncorrelated readings from a specific sensor helps in detecting a faulty sensor, (2) faulty sensors are detected near the source and isolated preventing them from affecting the accuracy of the overall aggregated data and reducing the overall delay. Results show that a faulty sensor can be detected with an average accuracy of 94 %. With increase in node density, accuracy in faulty sensor detection improves as more nodes are able to report the information to their nearest tree node.
  • Keywords
    fault tolerance; polynomial approximation; telecommunication network reliability; wireless sensor networks; fault tolerance; faulty sensor detection; function approximation; overall delay; polynomial-based data aggregation scenario; wireless sensor networks; Computer networks; Delay estimation; Distributed computing; Fault detection; Fault diagnosis; Fault tolerance; Mobile computing; Polynomials; Sensor phenomena and characterization; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Global Telecommunications Conference, 2007. GLOBECOM '07. IEEE
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1042-2
  • Electronic_ISBN
    978-1-4244-1043-9
  • Type

    conf

  • DOI
    10.1109/GLOCOM.2007.178
  • Filename
    4411088