• DocumentCode
    2496733
  • Title

    MCBCG: Model Checking Based Sequential Clock-Gating

  • Author

    Ahuja, Sumit ; Shukla, Sandeep

  • Author_Institution
    CESCA, Virginia Tech, Blacksburg, VA, USA
  • fYear
    2009
  • fDate
    4-6 Nov. 2009
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    Dynamic power reduction techniques such as sequential clock-gating aim at eliminating inconsequential computation and clock-toggles of the registers. Usually sequential clock-gating opportunities are discovered manually based on certain characteristics of a design (e.g. pipelining). Since manual addition of sequential gating circuitry might change the functionality of the design, sequential equivalence checking is needed after such changes. Tools for sequential equivalence checking are expensive, and based on recent technologies. Therefore, it is desirable to automate the discovery of sequential clock-gating opportunities using already existing and proven technologies such as model checking and thereby a priori proving that the changes will not affect the required functionality. Model Checking Based Sequential Clock Gating (MCBCG) method formally proves particular sequential dependencies of registers on other registers and logic, thus sequentially gating such registers will not require further validation. An automation scheme for MCBCG methodology is also proposed in this paper. Preliminary experiments show up to 30% more savings than the traditional (combinational) clock-gating based power reduction techniques.
  • Keywords
    CMOS logic circuits; logic design; power aware computing; power consumption; sequential circuits; system-on-chip; dynamic power reduction techniques; model checking based sequential clock gating method; registers; sequential clock-gating technique; sequential equivalence checking; Automation; CMOS logic circuits; CMOS technology; Clocks; Design optimization; Energy consumption; Optimization methods; Personal digital assistants; Pipeline processing; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    1552-6674
  • Print_ISBN
    978-1-4244-4823-4
  • Electronic_ISBN
    1552-6674
  • Type

    conf

  • DOI
    10.1109/HLDVT.2009.5340181
  • Filename
    5340181