DocumentCode :
2496733
Title :
MCBCG: Model Checking Based Sequential Clock-Gating
Author :
Ahuja, Sumit ; Shukla, Sandeep
Author_Institution :
CESCA, Virginia Tech, Blacksburg, VA, USA
fYear :
2009
fDate :
4-6 Nov. 2009
Firstpage :
20
Lastpage :
25
Abstract :
Dynamic power reduction techniques such as sequential clock-gating aim at eliminating inconsequential computation and clock-toggles of the registers. Usually sequential clock-gating opportunities are discovered manually based on certain characteristics of a design (e.g. pipelining). Since manual addition of sequential gating circuitry might change the functionality of the design, sequential equivalence checking is needed after such changes. Tools for sequential equivalence checking are expensive, and based on recent technologies. Therefore, it is desirable to automate the discovery of sequential clock-gating opportunities using already existing and proven technologies such as model checking and thereby a priori proving that the changes will not affect the required functionality. Model Checking Based Sequential Clock Gating (MCBCG) method formally proves particular sequential dependencies of registers on other registers and logic, thus sequentially gating such registers will not require further validation. An automation scheme for MCBCG methodology is also proposed in this paper. Preliminary experiments show up to 30% more savings than the traditional (combinational) clock-gating based power reduction techniques.
Keywords :
CMOS logic circuits; logic design; power aware computing; power consumption; sequential circuits; system-on-chip; dynamic power reduction techniques; model checking based sequential clock gating method; registers; sequential clock-gating technique; sequential equivalence checking; Automation; CMOS logic circuits; CMOS technology; Clocks; Design optimization; Energy consumption; Optimization methods; Personal digital assistants; Pipeline processing; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International
Conference_Location :
San Francisco, CA
ISSN :
1552-6674
Print_ISBN :
978-1-4244-4823-4
Electronic_ISBN :
1552-6674
Type :
conf
DOI :
10.1109/HLDVT.2009.5340181
Filename :
5340181
Link To Document :
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