DocumentCode
2496831
Title
Leadership Microprocessors: Validation, debug and test
Author
Shenoy, Sunil R.
Author_Institution
Intel, USA
fYear
2009
fDate
4-6 Nov. 2009
Firstpage
1
Lastpage
1
Abstract
I will discuss the use of high level design and abstraction for modeling, simulation and validation of leadership microprocessors, the challenges we have faced in this domain, our learnings and our vision and strategy for the future.
Keywords
Computer architecture; Face detection; Graphics; Microprocessors; Mobile computing; Testing; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
1552-6674
Print_ISBN
978-1-4244-4823-4
Electronic_ISBN
1552-6674
Type
conf
DOI
10.1109/HLDVT.2009.5340187
Filename
5340187
Link To Document