DocumentCode
2496919
Title
Fault detection in a tristate system environment
Author
Feng, Wenyi ; Huang, Wei Kang ; Meyer, Fred J. ; Lombardi, Fabrizio
Author_Institution
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
fYear
1998
fDate
2-4 Dec 1998
Firstpage
253
Lastpage
258
Abstract
We present a novel approach for detecting faults in tristate system environments-e.g., in multiple board systems. These environments are made of an interconnect and drivers/receivers with tristate features. We present a comprehensive fault model that includes faults in terminals (drivers/receivers) and nets. Under this fault model, physical faults (stuck-at and short), as well as functional faults (dominance, permanently enabled or permanently disabled driver modes), are taken into account. We show that, for a single net with L drivers, 2L tests are necessary and sufficient for fault detection. This is independent of the number of receivers. We extend this result to a system environment with N nets and where K is the maximal number of drivers for a net. Under the proposed fault model, any number of faults of any type can be detected in a system environment using any types that can be detected in a system environment using max (2K, P) tests, where P is the minimal integer that satisfies C/2P⩾N. If only the traditional (wired-AND or wired-OR) model is assumed, then the test set required for fault detection can be further reduced. We provide simulation results and show that the proposed approach outperforms previous methods found in the technical literature
Keywords
boundary scan testing; fault diagnosis; interconnections; logic testing; printed circuit testing; ternary logic; drivers/receivers; fault detection; fault model; functional faults; interconnect testing; multiple board systems; physical faults; tristate system environment; wired-AND model; wired-OR model; Application specific integrated circuits; Assembly; Computer science; Electrical fault detection; Fault detection; Integral equations; Laboratories; Rivers; Sequential analysis; System testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741621
Filename
741621
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