DocumentCode :
2496964
Title :
Statistical characterization and segmentation of drusen in fundus images
Author :
Santos-Villalobos, H. ; Karnowski, T.P. ; Aykac, D. ; Giancardo, L. ; Li, Y. ; Nichols, T. ; Tobin, K.W., Jr. ; Chaum, E.
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
6236
Lastpage :
6241
Abstract :
Age related Macular Degeneration (AMD) is a disease of the retina associated with aging. AMD progression in patients is characterized by drusen, pigmentation changes, and geographic atrophy, which can be seen using fundus imagery. The level of AMD is characterized by standard scaling methods, which can be somewhat subjective in practice. In this work we propose a statistical image processing approach to segment drusen with the ultimate goal of characterizing the AMD progression in a data set of longitudinal images. The method characterizes retinal structures with a statistical model of the colors in the retina image. When comparing the segmentation results of the method between longitudinal images with known AMD progression and those without, the method detects progression in our longitudinal data set with an area under the receiver operating characteristics curve of 0.99.
Keywords :
biomedical optical imaging; diseases; eye; image segmentation; medical image processing; statistical analysis; AMD progression; age related macular degeneration; disease; drusen; fundus images; geographic atrophy; image segmentation; pigmentation; statistical characterization; Biomedical imaging; Blood vessels; Diseases; Image color analysis; Image segmentation; Lesions; Retina; Algorithms; Atrophy; Colorimetry; Databases, Factual; Disease Progression; Fundus Oculi; Humans; Image Processing, Computer-Assisted; Macular Degeneration; Models, Statistical; Neural Networks (Computer); Normal Distribution; Pigmentation; ROC Curve; Retina; Retinal Drusen;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6091540
Filename :
6091540
Link To Document :
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