A novel technique to measure propagation loss of optical waveguides

Author

Barai, Samit ; Selvarajan, A. ; Srinivas, T. ; Madhan, T. ; Fazludeen, R.

Author_Institution

Dept. of Electr. & Comput. Eng., Indian Inst. of Sci., Bangalore, India

fYear

2003

fDate

17-18 Nov. 2003

Firstpage

250

Lastpage

254

Abstract

A method to measure the propagation loss of optical waveguides is discussed. The measurement system involves two 3dB couplers, a CCD camera and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of waveguides prepared by proton exchange (PE) in lithium niobate (LiNbO₃) and silver ion exchange in BK7 glass substrates are examined. Finally the variation of mode propagation loss for various annealing parameters of PE waveguides is discussed.

Keywords

CCD image sensors; ion exchange; loss measurement; microwave propagation; optical waveguides; 3dB couplers; CCD camera; LiNbO₃; annealing parameters; coupling conditions; glass substrates; lithium niobate; optical waveguides; propagation loss; propagation properties; proton exchange; signal processing unit; silver ion exchange; Charge coupled devices; Charge-coupled image sensors; Couplers; Lithium niobate; Loss measurement; Optical propagation; Optical signal processing; Optical waveguides; Propagation losses; Protons;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on

Print_ISBN

0-7803-7904-7

Type

conf

DOI

10.1109/EDMO.2003.1260067

Filename

1260067