Title :
A novel technique to measure propagation loss of optical waveguides
Author :
Barai, Samit ; Selvarajan, A. ; Srinivas, T. ; Madhan, T. ; Fazludeen, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Indian Inst. of Sci., Bangalore, India
Abstract :
A method to measure the propagation loss of optical waveguides is discussed. The measurement system involves two 3dB couplers, a CCD camera and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of waveguides prepared by proton exchange (PE) in lithium niobate (LiNbO3) and silver ion exchange in BK7 glass substrates are examined. Finally the variation of mode propagation loss for various annealing parameters of PE waveguides is discussed.
Keywords :
CCD image sensors; ion exchange; loss measurement; microwave propagation; optical waveguides; 3dB couplers; CCD camera; LiNbO3; annealing parameters; coupling conditions; glass substrates; lithium niobate; optical waveguides; propagation loss; propagation properties; proton exchange; signal processing unit; silver ion exchange; Charge coupled devices; Charge-coupled image sensors; Couplers; Lithium niobate; Loss measurement; Optical propagation; Optical signal processing; Optical waveguides; Propagation losses; Protons;
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN :
0-7803-7904-7
DOI :
10.1109/EDMO.2003.1260067
