Title :
March PS(23N) test for DRAM pattern-sensitive faults
Author :
Yarmolik, V. ; Klimets, Yu. ; Demidenko, S.
Author_Institution :
Byelorussian State Univ. of Inf. & Radio Electron., Minsk, Byelorussia
Abstract :
March algorithms are widely used in DRAM testing. They are relatively simple yet providing high fault coverage especially with respect to stuck-at faults, address uniqueness faults, and some types of cell-interaction faults. At the same time the capability of traditional March tests to detect pattern-sensitive faults is rather limited. This paper proposes an approach to enhance March test detection capability with respect to the pattern-sensitive faults
Keywords :
DRAM chips; automatic test pattern generation; fault location; integrated circuit testing; logic testing; ATPG; DRAM pattern-sensitive faults; DRAM testing; March PS(23N) test; March algorithm; March test detection capability; address uniqueness faults; cell-interaction faults; dynamic RAM; high fault coverage; stuck-at faults; Circuit faults; Circuit testing; Cybernetics; Digital integrated circuits; Digital systems; Electrical fault detection; Electronic equipment testing; Electronics industry; Fault detection; Informatics; Logic testing; Random access memory; Read-write memory;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741638
