DocumentCode
2497389
Title
Analog module metrology using MNABST-1 P1149.4 test chip
Author
Chen, Yue-Tsang ; Su, Chauchin
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
fYear
1998
fDate
2-4 Dec 1998
Firstpage
378
Lastpage
382
Abstract
This paper presents a metrology to extend P1149.4 from external component testing to internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Furthermore, it also extends the frequency range by one order
Keywords
analogue circuits; circuit testing; test equipment; MNABST-1 P1149.4 test chip; analog module metrology; internal module measurement; measurement SNR; parasitic effects tolerance; test signal variation tolerance; Circuit testing; Data mining; Design for testability; Distortion; Hardware; Metrology; Printed circuits; Read only memory; Semiconductor device measurement; Signal restoration; Surface-mount technology; Variable structure systems; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741642
Filename
741642
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