Title :
Analog module metrology using MNABST-1 P1149.4 test chip
Author :
Chen, Yue-Tsang ; Su, Chauchin
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Abstract :
This paper presents a metrology to extend P1149.4 from external component testing to internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Furthermore, it also extends the frequency range by one order
Keywords :
analogue circuits; circuit testing; test equipment; MNABST-1 P1149.4 test chip; analog module metrology; internal module measurement; measurement SNR; parasitic effects tolerance; test signal variation tolerance; Circuit testing; Data mining; Design for testability; Distortion; Hardware; Metrology; Printed circuits; Read only memory; Semiconductor device measurement; Signal restoration; Surface-mount technology; Variable structure systems; Wires;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741642
