DocumentCode
2497427
Title
Studies of Micron Order Defects in Quartz by a High Angular Resolved X-Ray Small Angle Scattering Technique
Author
Suzuki, Carlos K. ; Iwasaki, Fumiko ; Kohra, Kazutake
fYear
1980
fDate
1980
Firstpage
14
Lastpage
24
Keywords
Amorphous materials; Annealing; Crystals; Diffraction; Energy resolution; Laboratories; Power engineering and energy; Size measurement; Surfaces; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
34th Annual Symposium on Frequency Control. 1980
Type
conf
DOI
10.1109/FREQ.1980.200379
Filename
1537319
Link To Document