DocumentCode :
2497467
Title :
Transmission-line Characterization With Ultrafast Optoeletromes
Author :
Arjavalingam, G. ; Deutsch, A. ; Scheuermann, M.R.
Author_Institution :
Thomas J. Watson Research Center
fYear :
1993
fDate :
19-21 July 1993
Firstpage :
52
Lastpage :
53
Abstract :
Summary form only given.Recent advances in the characterization of resistive transmission lines by optoelectronically - generated ultrashort electrical pulses will be discussed. Resistive transmission lines are those in which dielectric losses are negligible, and where attenuation is dominated by losses in the metallic interconnections. Circuit-to-circuit wiring on large integrated circuits and in most modem electronic inter-chip interconnection structures are examples of resistive transmission lines. So are the coplanar waveguides and microstrip lines, fabricated on insulating substrates, commonly used in microwave hybrids.
Keywords :
Character generation; Coplanar transmission lines; Dielectric losses; Dielectric substrates; Distributed parameter circuits; Integrated circuit interconnections; Microwave propagation; Propagation losses; Pulse generation; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packaging/Gigabit Networks., LEOS 1993 Summer Topi
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-1284-8
Type :
conf
DOI :
10.1109/LEOSST.1993.696804
Filename :
696804
Link To Document :
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