DocumentCode
2497486
Title
Reflectivity analysis of the Bragg reflector based on periodic structures of different thin layers
Author
Purica, Munizer ; Budianu, E. ; Kusko, M. ; Dragoman, D.
Author_Institution
Nat. Inst. for R&D in Microtechnologies, Bucharest, Romania
fYear
2003
fDate
17-18 Nov. 2003
Firstpage
296
Lastpage
301
Abstract
An analytical model for calculating the reflection and transmission coefficients of a Bragg reflector with periodic structure is derived. Using explicit expressions for these coefficients the reflectivity of the periodic structures for different pairs of layers and layer thickness was simulated. We investigate the reflectivity of the periodic structures consisting of following pairs of successive layers: SiO2/Si3N4 (low ratio of refractive indexest); poly-Si/SiO2(high ratio), Si/air gap (high contrast). The theoretical and experimental investigations of a particular periodic structure consisting of SiO2/Au are also presented. Our method allows the rapid evaluation of reflectance of Bragg reflector with periodic structure.
Keywords
distributed Bragg reflectors; gold; microwave photonics; periodic structures; reflectivity; silicon compounds; Bragg reflector; SiO2-Au; SiO2-Si3N4; periodic structures; reflection coefficients; reflectivity analysis; thin layers; transmission coefficients; Analytical models; Dielectrics; Gold; Magnetic analysis; Optical filters; Optical reflection; Periodic structures; Photodetectors; Reflectivity; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN
0-7803-7904-7
Type
conf
DOI
10.1109/EDMO.2003.1260089
Filename
1260089
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