• DocumentCode
    2497486
  • Title

    Reflectivity analysis of the Bragg reflector based on periodic structures of different thin layers

  • Author

    Purica, Munizer ; Budianu, E. ; Kusko, M. ; Dragoman, D.

  • Author_Institution
    Nat. Inst. for R&D in Microtechnologies, Bucharest, Romania
  • fYear
    2003
  • fDate
    17-18 Nov. 2003
  • Firstpage
    296
  • Lastpage
    301
  • Abstract
    An analytical model for calculating the reflection and transmission coefficients of a Bragg reflector with periodic structure is derived. Using explicit expressions for these coefficients the reflectivity of the periodic structures for different pairs of layers and layer thickness was simulated. We investigate the reflectivity of the periodic structures consisting of following pairs of successive layers: SiO2/Si3N4 (low ratio of refractive indexest); poly-Si/SiO2(high ratio), Si/air gap (high contrast). The theoretical and experimental investigations of a particular periodic structure consisting of SiO2/Au are also presented. Our method allows the rapid evaluation of reflectance of Bragg reflector with periodic structure.
  • Keywords
    distributed Bragg reflectors; gold; microwave photonics; periodic structures; reflectivity; silicon compounds; Bragg reflector; SiO2-Au; SiO2-Si3N4; periodic structures; reflection coefficients; reflectivity analysis; thin layers; transmission coefficients; Analytical models; Dielectrics; Gold; Magnetic analysis; Optical filters; Optical reflection; Periodic structures; Photodetectors; Reflectivity; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
  • Print_ISBN
    0-7803-7904-7
  • Type

    conf

  • DOI
    10.1109/EDMO.2003.1260089
  • Filename
    1260089