Title :
Effect of the Porosity of PZT Thick Films on Mass Sensitivity and Resonance Force for Cantilever Type Bio Sensors
Author :
Jae Hong Park ; Tae Yun Kwon ; Dae Sung Yoon ; Tae Song Kim ; Hwan Kim
Author_Institution :
Korea Inst. of Sci. & Technol., Seoul
Abstract :
PZT thick films fabricated through the screen printing show a porosity ranging from 20% to 40%. Unfortunately, these high porosities of thick films greatly affect electromechanical characteristics of PZT thick film cantilevers. In this paper, we report a systematic analysis regarding the effect of the thick film porosity on the electromechanical characteristics of the PZT thick film cantilever. PZT (Pb(Zr0.52Ti0.48)O3) thick film cantilever devices were successfully fabricated on a Pt/Ti02/SiNx/Si substrate using a screen printing method and MEMS processes. Theoretical calculations of mass sensitivity and actuating force of PZT thick film cantilevers are presented with respect to material properties (density and Young´s modulus) and geometry (length, width, and thickness) of PZT thick films, which are dependent on experimentally verified material and geometrical parameters. From the result of modeling, it is confirmed that the increase of Young´s modulus due to the decrease of porosity of PZT thick films is more efficient than the control of the cantilever geometry, for increasing the cantilever resonating force. On the other hand, the optimization of geometric constituents is more effective than the control of densification of PZT thick films, for increasing the cantilever sensitivity.
Keywords :
biosensors; cantilevers; lead compounds; microsensors; porosity; thick film sensors; zirconium compounds; MEMS processes; PZT; PZT thick film cantilever; Young´s modulus; actuating force; cantilever sensitivity; cantilever type biosensors; electromechanical characteristics; mass sensitivity; resonance force; screen printing method; thick film porosity; Biosensors; Force sensors; Geometry; Material properties; Micromechanical devices; Printing; Resonance; Substrates; Thick films; Thickness control;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355847