Title :
Highly Precise Measurement of Orientation Angle for Crystal Blanks
Author :
Asanuma, N. ; Asahara, J.
Keywords :
Atom optics; Atomic measurements; Crystallography; Frequency; Geometrical optics; Goniometers; Manufacturing processes; Measurement errors; Measurement standards; Quality control;
Conference_Titel :
34th Annual Symposium on Frequency Control. 1980
DOI :
10.1109/FREQ.1980.200393