DocumentCode :
2497760
Title :
Production Statistics of SC (or TTC) Crystals
Author :
Kusters, John A. ; Adams, Charles A.
fYear :
1980
fDate :
1980
Firstpage :
167
Lastpage :
174
Keywords :
Automatic testing; Circuit testing; Crystals; Electrical resistance measurement; Frequency; Oscillators; Production; Statistics; System testing; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
34th Annual Symposium on Frequency Control. 1980
Type :
conf
DOI :
10.1109/FREQ.1980.200398
Filename :
1537338
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2497760
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