DocumentCode
2497848
Title
Testing Embedded Memories: Is BIST The Ultimate Solution?
Author
Wu, Cheng-Wen
fYear
1998
fDate
2-4 Dec 1998
Firstpage
516
Lastpage
517
Keywords
Application specific integrated circuits; Automatic testing; Built-in self-test; Flash memory; Logic devices; Logic testing; Random access memory; Redundancy; Semiconductor device noise; Semiconductor memory; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741668
Filename
741668
Link To Document