DocumentCode

2497902

Title

Testing Embedded Memories: Is BIST The Ultimate Solution? Answers to the Key Issues

Author

van de Goor, A.J.

fYear

1998

fDate

2-4 Dec. 1998

Firstpage

520

Lastpage

525

Keywords

Application specific integrated circuits; Built-in self-test; Fault detection; Hardware; Logic testing; System testing; Temperature dependence;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

Conference_Location

Singapore

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741671

Filename

741671