QCR Measurements on Formation of Multilayers Using SAM Technique

This contribution presents a concept of carrier multilayer preparation on quartz crystal resonators (QCR). Multilayers consist of several self assembled silane-based monolayers with a decreasing overall density. The resulting layers have a defined and stable structure. The formation process has been monitored by QCR measurements. For this purpose a new measurement cell has been developed with a novel clamping technique. The preparation technique should allow the design of a wide variety of properties of the carrier film between the transducer and receptor layers for various sensing applications with improved acoustic properties and less artificial character.