DocumentCode :
2498041
Title :
FPGA timing, power, signal integrity and other challenges at 65 and 45 nm
Author :
Leventis, Paul
Author_Institution :
Altera Vietnam Technol. Center
fYear :
2008
fDate :
8-10 Dec. 2008
Abstract :
Summary form only given. The steady march towards smaller feature sizes has made ASIC design, modeling and verification increasingly more challenging. FPGAs present an even greater challenge, since this analysis work must be performed on the user desktop, at the push of a button and for any design, without over-burdening users with the details. In this talk, I will present a brief overview of a few of the modeling, analysis and optimization challenges Altera has faced and overcome on 65nm and 45nm devices. I will touch on modeling and simultaneous optimization across timing corners, hold-time modeling and optimization, on-die variation and jitter, end-of-life effects, metastability analysis, advanced power management techniques, and simultaneous switching noise.
Keywords :
field programmable gate arrays; jitter; optimisation; timing; ASIC design; Altera; FPGA timing; end-of-life effects; hold-time modeling; jitter; metastability analysis; on-die variation; optimization challenges; power management techniques; signal integrity; size 45 nm; size 65 nm; switching noise; Application specific integrated circuits; Energy management; Field programmable gate arrays; Metastasis; Performance analysis; Signal design; Timing jitter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ICECE Technology, 2008. FPT 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3783-2
Electronic_ISBN :
978-1-4244-2796-3
Type :
conf
DOI :
10.1109/FPT.2008.4762357
Filename :
4762357
Link To Document :
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