DocumentCode :
2498307
Title :
Ultrafast Scanning Probe Microscopy
Author :
Weiss, S. ; Bolkin, D. ; Ogletree, D.F. ; Salmeron, M. ; Chemla, D.S.
Author_Institution :
University of California
fYear :
1993
fDate :
19-21 July 1993
Firstpage :
57
Lastpage :
58
Keywords :
Atomic force microscopy; Image resolution; Optical microscopy; Optical pulses; Scanning probe microscopy; Signal resolution; Spatial resolution; Switches; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packaging/Gigabit Networks., LEOS 1993 Summer Topi
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-1284-8
Type :
conf
DOI :
10.1109/LEOSST.1993.696808
Filename :
696808
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2498307
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