• DocumentCode
    2498388
  • Title

    High-Q silicon flexural resonators for vibrating inertial sensors: Investigations of the limiting damping mechanisms

  • Author

    Le Foulgoc, B. ; Le Traon, O. ; Masson, S. ; Parent, A. ; Bourouina, Tarik ; Marty, Frederic ; Bosseboeuf, A. ; Parrain, F. ; Mathias, Herve ; Grilles, J.-P.

  • Author_Institution
    ONERA, Chatillon
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    1365
  • Lastpage
    1368
  • Abstract
    In designing micro-scale vibrating sensors, the achievement of very high quality factor (Q) resonators working in bending mode remains a major issue. Special attention has been paid in this work to explore the Q limitations of single-crystal silicon bending beam resonators and their dependences on geometry, temperatures and pressure for a large range of resonators. In order to preserve the resonating element from support damping, a system with high decoupling efficiency has been optimized using FEM analyses and implemented. Quality factor as a function of frequency shows the transition between thermoelastic damping (TED) and surface damping as limiting mechanism with the miniaturization of the resonators: At high vacuum, the thermoelastic theory is experimentally validated to be the main damping source for Q up to 4.0x104. Beyond these values (Q > 1.4x105) the surface effects are evidenced and characterized with thickness and frequency variations.
  • Keywords
    damping; micromechanical devices; resonators; vibration measurement; FEM; high quality factor resonators; limiting damping mechanisms; microscale vibrating sensors; silicon flexural resonators; single-crystal silicon bending beam resonators; surface damping; thermoelastic damping; vibrating inertial sensors; Accelerometers; Damping; Frequency; Geometry; Mechanical sensors; Oscillators; Q factor; Silicon; Thermoelasticity; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2006. 5th IEEE Conference on
  • Conference_Location
    Daegu
  • ISSN
    1930-0395
  • Print_ISBN
    1-4244-0375-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.355884
  • Filename
    4178879