Title :
Photoluminescence excitation spectra from undoped InP
Author :
Yoshinaga, H. ; Makita, Y. ; Yamada, A. ; Tsai, Y. ; Iida, T. ; Shibata, Hajime ; Obara, A. ; Matsumori, T. ; Uekusa, S. ; Kaino, K. ; Oda, O.
Author_Institution :
Tokai Univ., Hiratsuka, Kanagawa, Japan
Abstract :
In extremely pure InP when samples are annealed, five sharp emissions labeled by Xi (i = 1-4) and W were observed slightly below bound exciton emissions. Selectively-excited photoluminescence and photoluminescence excitation measurements were made to examine the features of these five emissions in the spectrum of annealed undoped InP. Four sharp emissions were observed below bound exciton emissions in undoped InP when samples were annealed at above 350°C. Through low temperature photoluminescence excitation (PLE) spectroscopy, it was confirmed that these emissions are closely related with donor impurities. An additional sharp emission observed below the well-established donor-acceptor emission, denoted by W was also determined for the first time to be associated with the acceptor. It was concluded that PLE spectroscopy is a very powerful method to identify the origins of radiative transitions
Keywords :
III-V semiconductors; annealing; excitons; impurity states; indium compounds; photoluminescence; 350 degC; InP; PLE spectroscopy; annealed undoped InP; bound exciton emissions; donor impurities; donor-acceptor emission; low temperature photoluminescence excitation; photoluminescence excitation measurements; radiative transitions; sharp emission; undoped InP; Annealing; Excitons; Gallium arsenide; Impurities; Indium phosphide; Laser excitation; Photoluminescence; Plasma measurements; Wavelength measurement; Zinc;
Conference_Titel :
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location :
Paris
Print_ISBN :
0-7803-0993-6
DOI :
10.1109/ICIPRM.1993.380616