Title :
Telescoping Self-Aligned Metal-Catalyzed Carbon Nanotube Piezoresistors As Strain Gauges
Author :
Xie, Yan ; Tabib-Azar, Massood
Author_Institution :
Case Western Reserve Univ., Cleveland
Abstract :
Multi-walled carbon nanotube (MWCNT) bridges, grown using low-pressure metal-catalyzed chemical vapor deposition technique between silicon posts, were used as tiny piezoresistors to monitor vibration and bending/deformation of silicon cantilever beams. The weld strength of CNTs measured using atomic force microscope was larger than 100 nN/CNT and their full-scale resistance change was larger than 105 Omega.The effective longitudinal piezoresistivity of these CNTs was larger than 4 times 10-8 Pa-1 which is larger than that of Pi44 in silicon.
Keywords :
atomic force microscopy; cantilevers; carbon nanotubes; chemical vapour deposition; piezoresistive devices; resistors; strain gauges; atomic force microscope; low-pressure metal-catalyzed chemical vapor deposition; multiwalled carbon nanotube bridges; self-aligned metal-catalyzed carbon nanotube piezoresistors; silicon cantilever beams; silicon posts; strain gauges; tiny piezoresistors; weld strength; Atomic force microscopy; Atomic measurements; Bridges; Capacitive sensors; Carbon nanotubes; Chemical vapor deposition; Force measurement; Monitoring; Piezoresistive devices; Silicon;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355895