• DocumentCode
    2498797
  • Title

    Asymptotic BEP and SEP of Differential EGC in Correlated Ricean Fading and Non-Gaussian Noise

  • Author

    Nezampour, Ali ; Nasri, Amir ; Schober, Robert ; Ma, Yao

  • Author_Institution
    Univ. of British Columbia, Vancouver
  • fYear
    2007
  • fDate
    26-30 Nov. 2007
  • Firstpage
    1540
  • Lastpage
    1545
  • Abstract
    In this paper, we study the asymptotic behavior of the bit-error probability (BEP) and symbol-error probability (SEP) of differential M-ary phase-shift keying with differential equal gain combining (DEGC) in correlated Ricean fading and non-Gaussian noise, which in our definition also includes interference. We derive simple and easy-to-evaluate asymptotic BEP and SEP expressions which show that at high signal- to-noise ratios (SNRs) the performance of DEGC depends on certain moments of the noise and interference impairing the transmission. We provide closed-form expressions for these moments for practically important types of noise such as Gaussian noise, Gaussian mixture noise, and correlated co-channel interference. In addition, we show that the performance loss of DEGC compared to coherent maximum ratio combining (MRC) is always 3 dB independent of the type of noise if only one diversity branch is available but strongly depends on the type of noise if multiple diversity branches are combined.
  • Keywords
    Rician channels; differential phase shift keying; diversity reception; error statistics; DEGC; asymptotic BEP; asymptotic SEP; bit-error probability; closed-form expression; correlated Ricean fading; differential M-ary phase-shift keying; differential equal gain combining; multiple diversity; nonGaussian noise; symbol-error probability; AWGN; Additive white noise; Diversity reception; Fading; Gaussian noise; Interference; Performance analysis; Signal analysis; Signal to noise ratio; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Global Telecommunications Conference, 2007. GLOBECOM '07. IEEE
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1042-2
  • Electronic_ISBN
    978-1-4244-1043-9
  • Type

    conf

  • DOI
    10.1109/GLOCOM.2007.296
  • Filename
    4411206