Title :
Heterojunction tunnel structures as devices
Author_Institution :
Surrey Res. Centre for Ion Beam Appl., Surrey Univ., Guildford, UK
Abstract :
Semiconductor multilayer structures which contain ultra-thin tunnel barriers have been used to produce a wide variety of prototype devices with very attractive figures of merit. Some of the remaining problems that have prevented commercialisation are discussed. These problems also challenge mainstream silicon microelectronics, and some further novel structures are described that might allow a degree of integration perpendicular to the wafer surface. In particular it is possible to ion implant through tunnel structures to modify the properties of deeper layers, and yet restore the pristine electronic properties by annealing. Tunnelling must be tamed if the momentum of the microelectronic revolution is to be maintained for more than another 10 years
Keywords :
annealing; ion implantation; microwave detectors; microwave diodes; microwave transistors; tunnel diodes; tunnel transistors; annealing; double barrier diodes; figures of merit; heterojunction tunnel structures; ion implant; microwave tunnel detector; perpendicular integration; semiconductor multilayer structures; ultra-thin tunnel barriers; vertical integration; Detectors; Heterojunctions; Manufacturing; Microelectronics; Nonhomogeneous media; Prototypes; Schottky diodes; Secondary generated hot electron injection; Silicon; Tunneling;
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1997. EDMO. 1997 Workshop on
Conference_Location :
London
Print_ISBN :
0-7803-4135-X
DOI :
10.1109/EDMO.1997.668520