DocumentCode :
2498800
Title :
Heterojunction tunnel structures as devices
Author :
Kelly, M.J.
Author_Institution :
Surrey Res. Centre for Ion Beam Appl., Surrey Univ., Guildford, UK
fYear :
1997
fDate :
24-25 Nov 1997
Firstpage :
67
Lastpage :
69
Abstract :
Semiconductor multilayer structures which contain ultra-thin tunnel barriers have been used to produce a wide variety of prototype devices with very attractive figures of merit. Some of the remaining problems that have prevented commercialisation are discussed. These problems also challenge mainstream silicon microelectronics, and some further novel structures are described that might allow a degree of integration perpendicular to the wafer surface. In particular it is possible to ion implant through tunnel structures to modify the properties of deeper layers, and yet restore the pristine electronic properties by annealing. Tunnelling must be tamed if the momentum of the microelectronic revolution is to be maintained for more than another 10 years
Keywords :
annealing; ion implantation; microwave detectors; microwave diodes; microwave transistors; tunnel diodes; tunnel transistors; annealing; double barrier diodes; figures of merit; heterojunction tunnel structures; ion implant; microwave tunnel detector; perpendicular integration; semiconductor multilayer structures; ultra-thin tunnel barriers; vertical integration; Detectors; Heterojunctions; Manufacturing; Microelectronics; Nonhomogeneous media; Prototypes; Schottky diodes; Secondary generated hot electron injection; Silicon; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1997. EDMO. 1997 Workshop on
Conference_Location :
London
Print_ISBN :
0-7803-4135-X
Type :
conf
DOI :
10.1109/EDMO.1997.668520
Filename :
668520
Link To Document :
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