Title : 
Leakage power reduction for coarse grained dynamically reconfigurable processor arrays with fine grained Power Gating technique
         
        
            Author : 
Saito, Yoshiki ; Shirai, Tomoaki ; Nakamura, Takuro ; Nishimura, Takashi ; Hasegawa, Yohei ; Tsutsumi, Satoshi ; Kashima, Toshihiro ; Nakata, Mitsutaka ; Takeda, Seidai ; Usami, Kimiyoshi ; Amano, Hideharu
         
        
            Author_Institution : 
Dept. of Inf. & Comput. Sci., Keio Univ., Yokohama
         
        
        
        
        
        
            Abstract : 
One of the benefits of coarse grained dynamically reconfigurable processor array(DRPA) is its low dynamic power consumption by operating a number of processing elements(PE) in parallel with low clock frequency. However, in the future advanced processes, leakage power will occupy a considerable part of the total power consumption, and it may degrade the advantage of DRPAs. In order to reduce the leakage power, a fine grained Power Gating(PG) is applied to a DRPA, MuCCRA-2.32b, and leakage power and area overhead are measured. We evaluated the effect of two control modes; Pair and Unit Individual based on layout design and real applications. It appears that by applying PG for ALUs and SMUs in PEs individually, 48% of leakage power can be reduced with 9.0% of area overhead.
         
        
            Keywords : 
power aware computing; reconfigurable architectures; ALU; SMU; coarse grained dynamically reconflgurable processor arrays; fine grained power gating technique; leakage power reduction; Area measurement; Clocks; Computer science; Degradation; Energy consumption; Engines; Frequency; Hardware; Power measurement; Routing;
         
        
        
        
            Conference_Titel : 
ICECE Technology, 2008. FPT 2008. International Conference on
         
        
            Conference_Location : 
Taipei
         
        
            Print_ISBN : 
978-1-4244-3783-2
         
        
            Electronic_ISBN : 
978-1-4244-2796-3
         
        
        
            DOI : 
10.1109/FPT.2008.4762410