DocumentCode :
2499099
Title :
On the production of semi-insulating buried layers in epitaxially grown InP by Fe ion implantation
Author :
Carnera, A. ; Gasparotto, A. ; Caldironi, M. ; Pellegrino, S. ; Tromby, M. ; Vidimari, F. ; Frigeri, C.
Author_Institution :
Dipartimento de Fisica, Unita INFM, Univ. di Padova, Italy
fYear :
1993
fDate :
19-22 Apr 1993
Firstpage :
337
Lastpage :
340
Abstract :
The realization of a semi-insulating buried layer in a InP-based epitaxial structure is discussed by the selective ion implantation of Fe. Results indicate the feasibility of the production of a buried semi-insulating, current-blocking region with the selective implant of Fe into InP followed by an epitaxial overgrowth. The study of the involved physical processes revealed many interesting aspects. A strong difference is evidenced between the annealing behavior of samples implanted above or below the amorphization threshold. Particular attention has been devoted to the study of the solid phase epitaxial growth of the amorphous layer and of the Fe redistribution and segregation mechanisms
Keywords :
III-V semiconductors; amorphisation; amorphous semiconductors; annealing; buried layers; indium compounds; ion implantation; iron; segregation; semiconductor doping; semiconductor growth; solid phase epitaxial growth; Fe redistribution; Fe segregation; InP:Fe; amorphization threshold; annealing; current-blocking region; epitaxial overgrowth; epitaxial structure; ion implantation; selective implant; semi-insulating buried layers; semiconductor; solid phase epitaxial growth; Annealing; Chemicals; Indium phosphide; Instruments; Ion implantation; Iron; Performance evaluation; Production; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location :
Paris
Print_ISBN :
0-7803-0993-6
Type :
conf
DOI :
10.1109/ICIPRM.1993.380641
Filename :
380641
Link To Document :
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